RL-TR-92-11, FINAL TECHNICAL REPORT: ADVANCED TECHNOLOGY COMPONENT DERATING (FEB-1992) [AD-A253-334]

RL-TR-92-11, FINAL TECHNICAL REPORT: ADVANCED TECHNOLOGY COMPONENT DERATING (FEB-1992) [AD-A253-334]., This report has been piepared to sumnaariza the tecbnical study performed to determine the derating criteria of advanced technology components. The study covered existing criteria from AFSC Pamphlet 800-27 and the dcvelopment of new criteria based on data, literature searches and the use of advanced technology prediction methods developed in RADC-TR-90-72. The devices that were investigated were: VHSIC, ASIC, MIMIC, Microprocessor, PROM, Power Transistors, P" Pulse Transistors, RF Multi-Transistor Packages, Photo Diodes, Photo Transistors, Jpto--Electronic Couplers, Injection Laser Diodes, LED, Hybrid Deposited Film Resistors, Chip Resistors and Capacitors and SAW devices. The results of the study are additional derating criteria that extend the range of AFSC Pamphlet 800-27. These data will be transitioned from the report to AFSC Pamphlet 800-27 for use by government and contractor personnel in derating electronics systems yielding increased safety nargins and improved system reliability.