RADC-TR-65-330, RELIABILITY PHYSICS NOTEBOOK (OCT-1965) [AD0624769]

RADC-TR-65-330, RELIABILITY PHYSICS NOTEBOOK (OCT-1965) [AD0624769]., The results of physical and chemical investigations on basic mechanisms and processes in materials which cause or contribute to degradation, aging, and failure of electronic devices are summarized. Data is presented, in practical form wherever possible, for use by design and test engineers concerned with the assessment, prediction, and improvement of the reliability of solid state electronic devices. Techniques and procedures for obtaining data on specific part types and for applying such data to accelerated testing, screening, and reliability prediction programs are discussed. Format of the report is designed to facilitate periodic revision and inclusion of results of future investigations in basic failure mechanisms in electronic materials.