MIL-STD-883-4, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)

MIL-STD-883-4, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)., This entire standard has been revised. This revision has resulted in many changes to the format, but the most significant one is the splitting the document into parts. See MIL–STD–883 for the change summary. Part 3 of this test method standard establishes uniform test methods for the electrical testing (digital) to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.