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MIL STD 0800 0899
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MIL-STD-881
B
MIL-STD-881B (NOTICE 1), MILITARY STANDARD: WORK BREAKDOWN STRUCTURES FOR DEFENSE MATERIEL ITEMS (2 JAN 1998) [S/S BY MIL-HDK-881]
MIL-STD-881
D
MIL-STD-881D (NOTICE-1), DEPARTMENT OF DEFENSE STANDARD PRACTICE: WORK BREAKDOWN STRUCTURES FOR DEFENSE MATERIEL ITEMS (19-JUN-2018)
MIL-STD-882
C
MIL-STD-882C, MILITARY STANDARD: SYSTEM SAFETY PROGRAM REQUIREMENTS (19 JAN 1993
MIL-STD-882
D
MIL-STD-882D, DEPARTMENT OF DEFENSE STANDARD PRACTICE: SYSTEM SAFETY (10 FEB 2000)
MIL-STD-882
E
MIL-STD-882E, DEPARTMENT OF DEFENSE STANDARD PRACTICE: SYSTEM SAFETY (11-MAY-2012)
MIL-STD-882
C
MIL-STD-882C (NOTICE 1), MILITARY STANDARD: SYSTEM SAFETY PROGRAM REQUIREMENTS (19 JAN 1996)
MIL-STD-883
E
MIL-STD-883E, DEPARTMENT OF DEFENSE TEST METHODS STANDARD: MICROCIRCUITS, TEST STANDARDS (31 DEC 1996) [S/S BY MIL-STD-883F]
MIL-STD-883
F
MIL-STD-883F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS, TEST STANDARDS (18 JUN 2004) [S/S BY MIL-STD-883G]
MIL-STD-883
G
MIL-STD-883G, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (28 FEB 2006) [S/S BY MIL-STD-883H]
MIL-STD-883
H
MIL-STD-883H, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (26 FEB 2010)
MIL-STD-883
J
MIL-STD-883J, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (07-JUN-2013)
MIL-STD-883
K
MIL-STD-883K, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (25-APR-2016)
MIL-STD-883
L
MIL-STD-883L, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (16-SEP-2019)
MIL-STD-883
MIL-STD-883-1, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR MICROCIRCUITS PART 1: TEST METHODS 1000-1999 9SUPERSEDING MIL-STD-883K W/ CHANGE-3]., (16-SEP-2019)
MIL-STD-883
E
MIL-STD-883E (NOTICE 1), MILITARY STANDARD: MICROCIRCUITS, TEST STANDARDS (01 DEC 1997)
MIL-STD-883
J/CHG-1
MIL-STD-883J (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (07-NOV-2013)
MIL-STD-883
K/CHG-1
MIL-STD-883K (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (20-JUL-2016)
MIL-STD-883
MIL-STD-883-2, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR MICROCIRCUITS PART 2: TEST METHODS 2000-2999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)
MIL-STD-883
E
MIL-STD-883E (NOTICE 2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (24 AUG 1998
MIL-STD-883
J/CHG2
MIL-STD-883J (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (14-MAR-2014)
MIL-STD-883
K/CHG-2
MIL-STD-883K (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (22-FEB-2017)
MIL-STD-883
MIL-STD-883-3, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ELECTRICAL TESTS (DIGITAL) FOR MICROCIRCUITS PART 3: TEST METHODS 3000-3999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)
MIL-STD-883
E
MIL-STD-883E (NOTICE 3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (05 NOV 1999)
MIL-STD-883
J/CHG-3
MIL-STD-883J (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (20-JUN-2014)
MIL-STD-883
K_CHG-3
MIL-STD-883K (w/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS [S/S BY MIL-STD-883L AND MIL-STD-883-1, -2, -3, -4, -5](03-MAY-2018)
MIL-STD-883
MIL-STD-883-4, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ELECTRICAL TESTS (LINEAR) FOR MICROCIRCUITS PART 4: TEST METHODS 4000-4999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)
MIL-STD-883
E
MIL-STD-883E (NOTICE 4), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (18 DEC 2000)
MIL-STD-883
J/CHG-4
MIL-STD-883J (W/ CHANGE-4), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (03-JUL-2014)
MIL-STD-883
MIL-STD-883-5, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST PROCEDURES FOR MICROCIRCUITS PART 5: TEST METHODS 5000-5999 [SUPERSEDING MIL-STD-883K w/CHANGE 3] (16-SEP-2019)
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