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MIL-STD-750/5, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 (03-JAN-2012)

MIL-STD-750/5, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 (03-JAN-2012)., Part 5 of this test method standard establishes uniform test methods for the basic high reliability space application testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices. The test methods are designated by numbers assigned in accordance with the following system: Revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 5001.2 designates the second revision of test method 5001. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number of this test method standard, and the details required in the summary of the applicable method shall be listed. To avoid the necessity for changing documents that refer to the test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 5001 versus 5001.2.)

MIL-STD-750/5

    

Version:
CHG-108-2018249.43 KB MIL-STD-750-5_CHG-1
01-2012209.98 KB MIL-STD-750_5

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