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FSC: 5961 - Semiconductor Devices and Associated Hardware

MIL-D-87157 - MIL-D-87157 (AMENDMENT 1), MILITARY SPECIFICATION: DISPLAYS, DIODE, LIGHT EMITTING, SOLID STATE, GENERAL SPECIFICATION FOR (10-FEB-1983) [S/S BY MIL-PRF-19500/708]
MIL-D-87157 - MIL-D-87157 (NOTICE 2), MILITARY SPECIFICATION: DISPLAYS, DIODE, LIGHT EMITTING, SOLID STATE, GENERAL SPECIFICATION FOR (17-APR-2003) [S/S BY MIL-PRF-19500/708]
MIL-D-87157 - MIL-D-87157 (NOTICE 1), MILITARY SPECIFICATION: DISPLAYS, DIODE, LIGHT EMITTING, SOLID STATE, GENERAL SPECIFICATION FOR (15-DEC-1988) [S/S BY MIL-PRF-19500/708]
MIL-HDBK-5961 A - MIL-HDBK-5961 (NOTICE 1), MILITARY HANDBOOK: LIST OF STANDARD SEMICONDUCTOR DEVICES (06 DEC 2005) [NO S/S DOCUMENT]
MIL-HDBK-5961 A - MIL-HDBK-5961A, MILITARY HANDBOOK: LIST OF STANDARD SEMICONDUCTOR DEVICES (05 NOV 1999) [NO S/S DOCUMENTS]
MIL-PRF-19500 K - MIL-PRF-19500K, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (11 MAR 1996) [SUPERSEDING MIL-S-19500J]
MIL-PRF-19500 L - MIL-PRF-19500L, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (22 OCT 1998)
MIL-PRF-19500 M - MIL-PRF-19500M, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (22 OCT 1999)
MIL-PRF-19500 N - MIL-PRF-19500N, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (30 NOV 2005)
MIL-PRF-19500 P - MIL-PRF-19500P, PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (20-OCT-2010)
MIL-PRF-19500 P - MIL-PRF-19500P (W/ AMENDMENT-1), PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (16-MAY-2012)
MIL-PRF-19500 P - MIL-PRF-19500P (W/ AMENDMENT-2), PERFORMANCE SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (10-APR-2014)
MIL-S-19500 J - MIL-S-19500J, MILITARY SPECIFICATION: SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (15 APR 1994) [S/S BY MIL-PRF-19500K]
MIL-STD-750/5 - MIL-STD-750/5, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 (03-JAN-2012)
MIL-STD-750/1 - MIL-STD-750/1, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (03-JAN-2012)
MIL-STD-750/2 - MIL-STD-750/2, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (03-JAN-2012)
MIL-STD-750/3 - MIL-STD-750/3, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999 (03-JAN-2012)
MIL-STD-750/4 - MIL-STD-750/4, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (03-JAN-2012)
MIL-STD-750/2 A - MIL-STD-750/2A, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (23-JAN-2015)
MIL-STD-750/1 A - MIL-STD-750/1A, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (11-DEC-2015)
MIL-STD-750/2 A-CHG-1 - MIL-STD-750/2A (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (24-DEC-2015)
MIL-STD-750/1 A_CHG-1 - MIL-STD-750/1A (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (13-MAY-2016)
MIL-STD-750/1 A_CHG-2 - MIL-STD-750/1A (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (12-AUG-2016)
MIL-STD-750 C - MIL-STD-750C (NOTICE 8), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (23 FEB 1996)
MIL-STD-750 C - MIL-STD-750C (NOTICE 7), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (30 JUN 1993)
MIL-STD-750/2 CHG-1 - MIL-STD-750/2 (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (25-JUN-2012)
MIL-STD-750/1 CHG-1 - MIL-STD-750/1 (W/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (11-MAR-2013)
MIL-STD-750/4 CHG-1 - MIL-STD-750/4 (w/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (15-AUG-2014)
MIL-STD-750/2 CHG-2 - MIL-STD-750/2 (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (23-NOV-2012)
MIL-STD-750/1 CHG-2 - MIL-STD-750/1 (W/ CHANGE-2), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (01-JUL-2013)
MIL-STD-750/2 CHG-3 - MIL-STD-750/2 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - TEST METHODS 2001 THROUGH 2999 (29-APR-2013)
MIL-STD-750/1 CHG-3 - MIL-STD-750/1 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (01-OCT-2013)
MIL-STD-750/2 CHG-4 - MIL-STD-750/2 (W/ CHANGE-4), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - TEST METHODS 2001 THROUGH 2999 (01-SEP-2013)
MIL-STD-750/1 CHG-4 - MIL-STD-750/1 (W/ CHANGE-4), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (22-AUG-2014)
MIL-STD-750/2 CHG-5 - MIL-STD-750/2 (W/ CHANGE-5), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES - TEST METHODS 2001 THROUGH 2999 (02-MAY-2014)
MIL-STD-750/1 CHG-5 - MIL-STD-750/1 (W/ CHANGE-5), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999 (24-APR-2015)
MIL-STD-750 D - MIL-STD-750D (NOTICE 3), DEPARTMENT OF DEFENSE: TEST METHODS FOR SEMICONDUCTOR DEVICES (29 FEB 2000)
MIL-STD-750 D - MIL-STD-750D (NOTICE 1), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (18 MAY 1995)
MIL-STD-750 D - MIL-STD-750D (NOTICE 2), MILITARY STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (23 FEB 1996)
MIL-STD-750 D - MIL-STD-750D, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: SEMICONDUCTOR DEVICES (28 FEB 1995)
MIL-STD-750 D - MIL-STD-750D (NOTICE 4), DEPARTMENT OF DEFENSE: TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES (30 APR 2001)
MIL-STD-750 D - MIL-STD-750D (NOTICE 5), DEPARTMENT OF DEFENSE: TEST METHOD STANDARD FOR SEMICONDUCTOR DEVICES (12 NOV 2002
MIL-STD-750 E - MIL-STD-750E, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (20 NOV 2006)
MIL-STD-750 F - MIL-STD-750F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (03-JAN-2012
MIL-STD-750 F-CHG-2 - MIL-STD-750F (W/ CHANGE-2) , DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TEST METHODS FOR SEMICONDUCTOR DEVICES (30-NOV-2016)
MIL-STD-839 - MIL-STD-839 (NOTICE-1), MILITARY STANDARD: PARTS WITH ESTABLISHED RELIABILITY LEVELS, SELECTION AND USE OF (09-JUL-1969) [NO S/S DOCUMENT]
MSFC-STD-3012 - MSFC-STD-3012, MSFC TECHNICAL STANDARD: EEE PARTS MANAGEMENT AND CONTROL FOR MSFC SPACE FLIGHT HARDWARE (17-DEC-1999)
MSFC-STD-3012 A - MSFC-STD-3012A, MSFC TECHNICAL STANDARD: ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE (14-FEB-2012)
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