MIL-STD-750/3, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999 (03-JAN-2012)

MIL-STD-750/3, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999 (03-JAN-2012)., Part 3 of this test method standard establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.