RADC-TR-85-91, FINAL TECHNICAL REPORT: IMPACT OF NON-OPERATING PERIODS ON EQUIPMENT RELIABILITY (MAY-1985)

RADC-TR-85-91, FINAL TECHNICAL REPORT: IMPACT OF NON-OPERATING PERIODS ON EQUIPMENT RELIABILITY (MAY-1985)., The objective of this study was to develop a procedure to viredict the quantitative effects of nonoperating periods on electronic equipmnent reliability. A series of nonoperating failure rate prediction models were developed at the component level. The models are capable of evaluating component nonoperating failure rate for any anticipated environment with the exception of a satellite environment. The proposed nonoperating failure rate prediction methodology is Intended to provide the ability to predict the component nonoperating failure rate and reliability as a function of the characteristics of the devices, technology employed in producing the device, and external factors such as environmental stresses which have a significant effect on device nonoperating reliability. The prediction methodology is presented ina form compatible with MIL-HDBK-2l7 as an Appendix to the technical report.