NASA/TP-2003-212244, NASA TECHNICAL PUBLICATION: PEM-INST-001: INSTRUCTIONS FOR PLASTIC ENCAPSULATED MICROCIRCUIT (PEM) SELECTION, SCREENING, AND QUALIFICATION (JUN 2003)

NASA/TP-2003-212244, NASA TECHNICAL PUBLICATION: PEM-INST-001: INSTRUCTIONS FOR PLASTIC ENCAPSULATED MICROCIRCUIT (PEM) SELECTION, SCREENING, AND QUALIFICATION (JUN 2003)., Potential users of plastic encapsulated microcircuits (PEMs) need to be reminded that unlike the military system of producing robust high-reliability microcircuits that are designed to perform acceptably in a variety of harsh environments, PEMs are primarily designed for use in benign environments where equipment is easily accessed for repair or replacement. The methods of analysis applied to military products to demonstrate high reliability cannot always be applied to PEMs. The qualification and screening processes contained in this document are intended to detect poor-quality lots and screen out early random failures from use in space flight hardware. However, since it cannot be guaranteed that quality was designed and built into PEMs that are appropriate for space applications, users cannot screen in quality that may not exist. It must be understood that due to the variety of materials, processes, and technologies used to design and produce PEMs, this test process may not accelerate and detect all failure mechanisms. While the tests herein will increase user confidence that PEMs with otherwise unknown reliability can be used in space environments, such testing may not guarantee the same level of reliability offered by military microcircuits. PEMs should only be used where due to performance needs there are no alternatives in the military high-reliability market, and projects are willing to accept higher risk.