MIL-PRF-55365H, PERFORMANCE SPECIFICATION: CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR (04 FEB 2011)

MIL-PRF-55365H, PERFORMANCE SPECIFICATION: CAPACITOR, FIXED, ELECTROLYTIC (TANTALUM), CHIP, ESTABLISHED RELIABILITY, NONESTABLISHED RELIABILITY, AND HIGH RELIABILITY, GENERAL SPECIFICATION FOR (04 FEB 2011)., This specification covers the general requirements for non-established reliability (non-ER), established reliability (ER), and high reliability tantalum dielectric, fixed chip capacitors, primarily intended for use in thick and thin film hybrid circuits or surface mount applications for filter, bypass, coupling, and other applications where the alternating current (ac) component is small compared to the direct current (dc) rated voltage and where supplemental moisture protection is available (see ). The established reliability capacitors have reliability ratings established on the basis of life tests performed at specified voltage at +85°C for failure rate levels (FRL) ranging from: a. 1.0 percent per 1,000 hours to 0.001 percent per 1,000 hours in accordance with MIL-STD-690. These FRL’s are established at a 60-percent confidence level and are maintained at a 10-percent producer’s risk (exponential distribution). b. 0.1 percent per 1,000 hours to 0.001 percent per 1,000 hours or 1 FIT (FIT = failure unit = one failure per 109 device hours) at 90-percent confidence level (Weibull distribution).