EverySpec Standards
Home > Library > DATA-ITEM-DESC-DIDs > DI-QCIC > DI-QCIC-81708

DI-QCIC-81708, DATA ITEM DESCRIPTION: NON-STANDARD PART QUALIFICATION/QUALITY CONFORMANCE TEST PLAN (24-NOV-2006)

DI-QCIC-81708, DATA ITEM DESCRIPTION: NON-STANDARD PART QUALIFICATION/QUALITY CONFORMANCE TEST PLAN (24-NOV-2006)., The purpose of the plan is to document the qualification and quality conformance procedure, including tests to be performed, order of testing, sample sizes, and other pertinent data relating to the qualification of non-standard parts. This Data Item Description (DID) contains the format and content preparation instructions for the Non-Standard Part Qualification/Quality Conformance Test Plan. This DID shall be used in conjunction with MIL-PRF-38535 (G) 1, “General Specification for Integrated Circuit Manufacturing,” (entire document), MIL-PRF-38534 (F), “General Specification for Hybrid Microcircuits,” (entire document), MIL-STD- 883G, “Test Method Standard for Microcircuits,” (Test Method 5004.11, Screening Procedures and Test Method 5005.14, Qualification and Quality Conformance Procedures) and other appropriate component specifications and program requirement documentation to ensure the parts are qualified to the appropriate reliability level (high reliability, military, industrial, commercial) and operating environment (space, tactical, ground, etc.). All custom microcircuits are considered non-standard parts. All non-custom integrated circuits, discrete components, magnetics, passives, etc. which are not procured as Qualified Products List (QPL), Qualified Manufacturers List (QML) or Standard Microcircuit Drawing (SMD) parts are considered non-standard parts. The following parts do not require the submission of a full Non-Standard Qualification/Quality Conformance Plan when the parts are considered non-standard because of additional space environment requirements such as Destructive Physical Analysis or Radiation. The submission of an abbreviated plan shall be required to state that the devices are being procured as QML, QPL or SMD parts and shall detail only the additional tests that are required. a. Non-custom microcircuits and hybrids procured as QML or QPL devices in accordance with MIL-PRF-38535 (G) 1 and MIL-PRF-38534 (F). b. Passive and magnetic parts that are procured as QPL parts c. JANS level parts for space programs d. JANTX parts for non-space programs

DI-QCIC-81708

    

Version:
11-200625.53 KB DI-QCIC-81708

Simple Search
MilSpec Search



About Us   |   Terms of Use   |   DMCA   |   Privacy   |   EverySpec LLC © 2009 - 2024   All rights reserved.