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TOP-1-1-030, TEST OPERATIONS PROCEDURE: RAM-D AND ILS ANALYSIS (08-SEP-2008)

TOP-1-1-030, TEST OPERATIONS PROCEDURE: RAM-D AND ILS ANALYSIS (08-SEP-2008)., This Test Operations Procedure (TOP) establishes guidelines to use when performing a reliability, availability, maintainability, durability (RAM-D), or integrated logistic supportability (ILS) analysis during developmental testing. This document is intended for use in assessing RAM-D and ILS characteristics of various types of materiel, including individual items and systems. The great variety and complexity of this materiel makes it impractical to prepare procedures precisely matched to each system type or category. For this reason, material as presented herein is general; test personnel should prepare procedures necessary for the specific item being considered. These analytical procedures apply to all reliability and durability developmental tests which are conducted by ATEC Developmental Test Centers. These include both government and contractor testing in support of research, development, and acquisition programs.

TOP-1-1-030

    

Version:
09-2008506.45 KB TOP-1-1-030

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