RADC-TR-80–237, RELIABILITY PREDICTION - MODELING OF NEW DEVICES (JUL 1980)

RADC-TR-80–237, RELIABILITY PREDICTION - MODELING OF NEW DEVICES (JUL 1980)., This report presents reliability prediction models for high density microcircuits including magnetic bubble and charge-coupled device memories for inclusion in MIL-HDBK-217C, "Reliability Prediction of Electronic Equipment".