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MIL-STD-750/4 (w/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (15-AUG-2014)

MIL-STD-750/4 (w/ CHANGE-1), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999 (15-AUG-2014)., Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term \"devices\" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

MIL-STD-750/4 Rev. CHG-1

    

Version:
CHG-208-20176.48 MB MIL-STD-750_4_CHG-2
CHG-108-20146.06 MB MIL-STD-750_4_CHG-1
01-20121.54 MB MIL-STD-750_4

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