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MIL-STD-750/2 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (07-FEB-2018)

MIL-STD-750/2 (W/ CHANGE-3), DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MECHANICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 2: TEST METHODS 2001 THROUGH 2999 (07-FEB-2018)., Part 2 of this test method standard establishes uniform test methods for the mechanical testing to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

MIL-STD-750/2 Rev. A_CHG-3

    

Version:
A_CHG-302-20189.11 MB MIL-STD-750-2A_CHG-3
A-CHG-112-20159.19 MB MIL-STD-750_2A_CHG-1
A01-201514.23 MB MIL-STD-750_2A
CHG-505-20148.99 MB MIL-STD-750-2_CHG-5
CHG-409-20138.86 MB MIL-STD-750-2_CHG-4
CHG-304-20138.67 MB MIL-STD-750_2_CHG-3
CHG-211-20127.85 MB MIL-STD-750-2_CHG-2
CHG-106-20128.73 MB MIL-STD-750_2_CHG-1
01-20129.86 MB MIL-STD-750_2

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